The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2022
Filed:
Mar. 05, 2019
Hitachi High-tech Corporation, Tokyo, JP;
Hiromichi Yamashita, Tokyo, JP;
HITACHI HIGH-TECH CORPORATION, Tokyo, JP;
Abstract
Provided is a chromatography mass spectrometry capable of peak detection that can deal with a wide concentration range of a sample component and providing an evaluated value for the result. A plurality of samples having different known concentrations of a component are measured to detect a start point, an apex, and an end point of a peak. Regarding the start point, the apex, and the end point of the detected peak, an evaluated value such as probability is provided as a score to determine a score function. A component having an unknown concentration is measured to detect a start point, an apex, and an end point of a peak. Regarding the start point, the apex, and the end point of the detected peak, the score function is applied to evaluate peak detection results, and a result having a high evaluated value is selected as a peak.