The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2022

Filed:

Jul. 27, 2020
Applicant:

Nevada Nanotech Systems Inc., Sparks, NV (US);

Inventors:

Benjamin S. Rogers, Reno, NV (US);

Christopher J. Dudley, Reno, NV (US);

Jesse D. Adams, Reno, NV (US);

Ralph G. Whitten, Reno, NV (US);

Alexander C. Woods, Reno, NV (US);

Vaughn N. Hartung, Reno, NV (US);

Assignee:

Nevada Nanotech Systems Inc., Sparks, NV (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 25/18 (2006.01); G01N 11/16 (2006.01); G01N 29/32 (2006.01); G01N 27/18 (2006.01); G01N 29/02 (2006.01); G01N 27/12 (2006.01); G01N 29/036 (2006.01); G01N 27/16 (2006.01); G01N 29/12 (2006.01);
U.S. Cl.
CPC ...
G01N 25/18 (2013.01); G01N 11/16 (2013.01); G01N 27/12 (2013.01); G01N 27/18 (2013.01); G01N 29/022 (2013.01); G01N 29/036 (2013.01); G01N 29/326 (2013.01); G01N 27/16 (2013.01); G01N 29/12 (2013.01); G01N 2291/0427 (2013.01);
Abstract

A system for determining one or more properties of one or more gases. The system comprises sensors configured to measure thermal conductivity and exothermic responses of a sample at multiple temperatures. Sensor responses to exposure to a gas sample at two or more temperatures are compensated and analyzed by a subsystem. The subsystem is configured to determine a thermal conductivity of the gas sample at each of the two or more temperatures and determine at least one component of the gas sample based at least in part on the thermal conductivity value of the sample at each of the two or more temperatures. Related systems and methods of determining one or more properties of a sample are also disclosed.


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