The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2022
Filed:
May. 19, 2017
Leibniz-institut Für Photonische, Jena, DE;
Friedrich-schiller-universität Jena, Jena, DE;
Jürgen Popp, Jena-Kunitz, DE;
Michael Schmitt, Jena, DE;
Tobias Meyer-Zedler, Jena, DE;
Stefan Nolte, Jena, DE;
Roland Ackermann, Berlin, DE;
Jens Limpert, Jena, DE;
LEIBNIZ-INSTITUT FUR PHOTONISCHE TECHNOLOGIEN E.V., Jena, DE;
FRIEDRICH-SCHILLER-UNIVERSITAT JENA, Jena, DE;
Abstract
An exemplary laser microscope can be provided, comprising at least one first laser source which emits at least one (e.g., pulsed) excitation beam, a scanning optical configuration (e.g., configured to scan the excitation beam over the surface of a sample), a focusing optical configuration (e.g., configured to focus the excitation beam onto the sample), and at least one detector configured to detect light emitted by the sample due to an optical effect in response to the excitation beam. A second laser source facilitates a pulsed ablation beam for a local ablation of the material of the sample. The ablation beam can be guided to the sample via the scanning and focusing optical configurations. The first and second laser sources can be fed by a mutual continuous wave pump laser and/or a mutual pulsed pump laser. The first laser source can emit pulses with at least two different wavelengths.