The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2022
Filed:
Jan. 31, 2018
Illumina, Inc., San Diego, CA (US);
John S. Vieceli, Encinitas, CA (US);
Alex Nemiroski, San Diego, CA (US);
Paul Belitz, San Diego, CA (US);
Robert Langlois, San Diego, CA (US);
M. Shane Bowen, Encinitas, CA (US);
Danny Yuan Chan, San Diego, CA (US);
Bala Murali K. Venkatesan, San Francisco, CA (US);
Hui Han, San Diego, CA (US);
Kevan Samiee, San Diego, CA (US);
Stephen Tanner, San Diego, CA (US);
Illumina, Inc., San Diego, CA (US);
Abstract
Fiducial markers are provided on patterned arrays of the type that may be used for molecular analysis, such as sequencing. The fiducial markers may have configurations that enhance their detection in image or detection data, that facilitate or improve processing, that provide encoding of useful information, and so forth. Examples of the fiducial markers may include features and materials that are provided on or in the support of a patterned array and that return at least a portion of incident light by reflection. The fiducial markers may form gratings or other encoding configurations that assist in image processing, alignment, or other aspects of processing of the patterned array.