The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2022

Filed:

Oct. 01, 2018
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Wei Luo, Yamanashi, JP;

Tadashi Okita, Yamanashi, JP;

Junichi Tezuka, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 99/00 (2011.01);
U.S. Cl.
CPC ...
G01M 99/005 (2013.01);
Abstract

To provide an observation apparatus, an observation method and an observation program capable of easily understandable output of a relation between a signal waveform representing an actually-observed operation of a machine and an instruction program to the machine. An observation apparatus includes an observation data acquisition unit for acquiring observation data on an operation status of a machine along with time information, an execution status acquisition unit for acquiring execution status data including an execution position and a specific parameter value for an instruction program to the machine, along with time information, and a display unit for displaying the observation data and the execution status data in association with each other in time series.


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