The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2022
Filed:
Mar. 30, 2018
Indigo Diabetes N.v., Zwijnaarde, BE;
Danaë Delbeke, Gentbrugge, BE;
Paolo Cardile, Ghent, BE;
Juan Sebastian Ordonez Orellana, Ghent, BE;
Ananth Subramanian, Mariakerke, BE;
Indigo Diabetes N.V., Zwijnaarde, BE;
Abstract
A method for testing an optical assembly () which has an optical microstructure () integrated with a substrate (). The optical microstructure () is positioned to form an external optical interaction area () on a part of a surface () of the substrate (). A cover cap () seals at least a part of the surface () of the substrate () adjacent to the optical microstructure () to obtain a sealed cavity (). An optical feedthrough () is integrated in the substrate () to form an external communication path from within the sealed cavity (). The optical feedthrough () allows communication of a physical parameter value which is measured inside the sealed cavity () to outside the sealed cavity (). The physical parameter value is associated with a measure of hermeticity of the sealed cavity ().