The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2022

Filed:

Jul. 05, 2021
Applicant:

Bertec Limited, Edinburgh, GB;

Inventors:

Necip Berme, Worthington, OH (US);

Sasan Ghassab, Columbus, OH (US);

Assignee:

Bertec Limited, Edinburgh, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 5/00 (2006.01);
U.S. Cl.
CPC ...
G01L 5/0052 (2013.01);
Abstract

A force measurement system is disclosed herein. The force measurement system includes a plurality of force measurement assemblies, at least some of the plurality of force measurement assemblies configured to be independently displaceable from other ones of the plurality of force measurement assemblies such that one or more particular ones of the plurality of force measurement assemblies that are disposed underneath a subject varies over time. Each of the plurality of force measurement assemblies includes a top surface for receiving at least one portion of the body of the subject; and at least one force transducer, the at least one force transducer configured to sense one or more measured quantities and output one or more signals that are representative of forces and/or moments being applied to the top surface of the force measurement assembly by the subject.


Find Patent Forward Citations

Berme, Necip. (2022). Force measurement system (U.S. Patent No. 11262258). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11262258

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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