The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2022

Filed:

Mar. 12, 2019
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Kazuya Kimura, Kizugawa, JP;

Masayuki Hayakawa, Kizugawa, JP;

Assignee:

OMRON Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/26 (2006.01); G01B 11/00 (2006.01); G01J 3/36 (2006.01); G01J 3/51 (2006.01);
U.S. Cl.
CPC ...
G01J 3/26 (2013.01); G01B 11/00 (2013.01); G01J 3/36 (2013.01); G01J 3/51 (2013.01);
Abstract

The present invention provides a wavelength detection device () provided with: a plurality of optical filters (); a splitting unit () which splits light and allows the split light to pass through each of the plurality of optical filters (); a plurality of light receiving elements () which detect the intensities of different beams of light which have passed through the optical filters, respectively; and a calculation unit () which calculates, from the outputs of the plurality of light receiving elements, physical quantities related to the transmittances of the plurality of optical filters, and calculates the wavelengths of the beams of light which have passed through the plurality of optical filters, on the basis of the transmittance characteristics, wherein the transmittance characteristics of the plurality of optical filters have an inclination section in different wavelength ranges of the wavelength range of the object to be measured.


Find Patent Forward Citations

Kimura, Kazuya. (2022). Wavelength detection device and confocal measurement device (U.S. Patent No. 11262238). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11262238

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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