The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2022

Filed:

May. 30, 2019
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Motoharu Okuno, Fukuchiyama, JP;

Hitoshi Nakatsuka, Kawanishi, JP;

Assignee:

OMRON Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01); G02B 7/04 (2021.01);
U.S. Cl.
CPC ...
G01B 11/254 (2013.01); G01B 11/2513 (2013.01); G02B 7/04 (2013.01);
Abstract

This three-dimensional measurement device includes: a light source, a lens guiding light from the light source to a subject, a photomask disposed on the optical axis between the light source and lens and having a predetermined pattern, a driving device changing the position of one member from the lens and photomask or changing an optical characteristic of the lens, and a control unit controlling the driving device. The control unit fixes an image formation position for light/dark pattern light formed by the photomask at the position of the subject by fixing the position of said member or the optical characteristic of the lens when specifying a first mode, and varies the position of the member or the optical characteristic of the lens to vary the image formation position for the light/dark pattern light such that the light/dark difference caused by the light/dark pattern light is smaller than in the first mode when specifying a second mode.


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