The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2022
Filed:
Oct. 31, 2019
Concept Laser Gmbh, Lichtenfels, DE;
Christian Dicken, Lichtenfels, DE;
Moritz Beck, Lichtenfels, DE;
CONCEPT LASER GMBH, Lichtenfels, DE;
Abstract
Methods for calibrating an irradiation device for an apparatus for additively manufacturing three-dimensional objects include generating at least two first and two second calibration patterns, in at least two different first positions and at least two different second positions; determining position information relating to the positions of the calibration patterns; generating a calibration quality value relating to a calibration status of the irradiation device; simulating at least two first calibration patterns and at least two second calibration patterns based on at least one changed irradiation parameter; determining a calibration quality value for the simulated calibration patterns; and repeating the simulation and determination of the calibration quality value until a maximum or minimum calibration quality value is reached.