The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2022

Filed:

Nov. 06, 2018
Applicant:

Sigma Labs, Inc., Santa Fe, NM (US);

Inventors:

Vivek R. Dave, Concord, NH (US);

Mark J. Cola, Santa Fe, NM (US);

Assignee:

SIGMA LABS, INC., Santa Fe, NM (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B22F 10/31 (2021.01); B29C 64/393 (2017.01); B33Y 50/02 (2015.01); B22F 10/20 (2021.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); G05B 15/00 (2006.01); B22F 10/30 (2021.01);
U.S. Cl.
CPC ...
B22F 10/20 (2021.01); B22F 10/31 (2021.01); B29C 64/393 (2017.08); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12); B22F 10/30 (2021.01); G05B 15/00 (2013.01);
Abstract

A system and a corresponding method of correcting temperature data from a non-imaging optical sensor involve collecting temperature data generated using the optical sensor. The temperature data describes temperature changes across a surface of a material during an additive manufacturing operation in which the material is heated by a heat source. The method includes estimating a size of a hot spot corresponding to a hottest region formed on the surface by the heat source; and estimating a size of a heated region corresponding to a locus of points within the field of view that contribute to the temperature data. The method further includes correcting the temperature data based on the estimated sizes of the hot spot and the heated region.


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