The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2022

Filed:

Jun. 20, 2017
Applicant:

Toshiba Medical Systems Corporation, Otawara, JP;

Inventor:

Magnus Wahrenberg, Edinburgh, GB;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/08 (2006.01); G06T 7/00 (2017.01); A61B 8/00 (2006.01); G06T 15/50 (2011.01); G06T 15/00 (2011.01);
U.S. Cl.
CPC ...
A61B 8/5207 (2013.01); A61B 8/08 (2013.01); A61B 8/44 (2013.01); A61B 8/461 (2013.01); A61B 8/466 (2013.01); A61B 8/483 (2013.01); G06T 7/0012 (2013.01); G06T 15/005 (2013.01); G06T 15/506 (2013.01); A61B 8/0866 (2013.01); G06T 2210/41 (2013.01);
Abstract

A medical image processing apparatus comprises processing circuitry configured to: obtain a medical imaging data set representative of at least part of at least one surface; render from the medical imaging data set at least one image of the at least part of the at least one surface, wherein the or each image is rendered using a respective lighting configuration; and determine a measure of lighting quality for the or each rendered image; wherein, for the or each rendered image, the determining of the measure of lighting quality comprises, for each of a plurality of locations on the at least part of the at least one surface, determine a correspondence between a curvature of the at least one surface at that location and a lighting value at that location, wherein the lighting value is obtained from the rendering of the image; and determine the measure of lighting quality based on the determined correspondences.


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