The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2022
Filed:
Nov. 14, 2019
Applicant:
GE Precision Healthcare Llc, Milwaukee, WI (US);
Inventors:
Feng Gao, Naperville, IL (US);
Mahesh Narayanaswamy, Wauwatosa, WI (US);
Assignee:
GE PRECISION HEALTHCARE LLC, Milwaukee, WI (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
A61B 6/5258 (2013.01); G06T 7/0012 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/20084 (2013.01);
Abstract
Various methods and systems are provided for x-ray imaging. In one embodiment, a method for an x-ray imaging system comprises acquiring, with an x-ray detector, an image including a noise artifact caused by electromagnetic interference, inputting the image to a trained neural network model to obtain a corrected image with the noise artifact removed, and outputting the corrected image. In this way, row-correlated noise artifacts caused by electromagnetic interference at the x-ray detector are eliminated or cancelled in real time and image quality is improved.