The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2022
Filed:
Mar. 17, 2020
Applicant:
The Climate Corporation, San Francisco, CA (US);
Inventors:
Bikash Basnet, St Louis, MO (US);
Keely Roth, San Francisco, CA (US);
Demir Devecigil, St. Charles, MO (US);
Valeriy Kovalskyy, Chesterfield, MO (US);
Assignee:
The Climate Corporation, San Francisco, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/235 (2006.01); H04N 5/365 (2011.01); H04N 5/217 (2011.01);
U.S. Cl.
CPC ...
H04N 5/2353 (2013.01); H04N 5/2176 (2013.01); H04N 5/365 (2013.01);
Abstract
In an embodiment, a computer-implemented method of calibrating an imaging system in real-time, comprising: obtaining a first reading by a first sensor; establishing a dynamic link between the first reading and exposure time of a second sensor; using the dynamic link to control the exposure time of the second sensor; obtaining a second reading by the second sensor during the controlled exposure time; wherein the steps are performed by one or more computing devices.