The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2022

Filed:

Sep. 19, 2018
Applicant:

The United States of America, As Represented BY the Secretary of the Navy, Crane, IN (US);

Inventors:

Joseph A. Fiordilino, Pittsburgh, PA (US);

Subrata Sanyal, Eastvale, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H02N 2/00 (2006.01); G01P 15/097 (2006.01); H02N 2/18 (2006.01); F16F 15/00 (2006.01); G01M 7/00 (2006.01); G02B 7/00 (2021.01); G02B 27/64 (2006.01); H04N 1/047 (2006.01); G01P 15/00 (2006.01);
U.S. Cl.
CPC ...
H02N 2/0075 (2013.01); F16F 15/005 (2013.01); G01M 7/00 (2013.01); G01P 15/097 (2013.01); G02B 7/008 (2013.01); G02B 27/646 (2013.01); H02N 2/005 (2013.01); H02N 2/181 (2013.01); H04N 1/047 (2013.01); G01P 15/00 (2013.01);
Abstract

The present invention relates to a device which can measure, induce, and correct perturbations acting on an electromagnetic (EM) propagation source. Piezoelectric transducers are used to measure and control perturbations within a system to improve operation of an EM source. Perturbation measurements can be used to determine the environmental and system impacts on the EM source. Moreover, measurements can be used to correct or nullify perturbations applied to the EM source, through active or passive means.


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