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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11257561 B1

PDFFull Text
Date of Patent:
Feb. 22, 2022

Filed:

Mar. 20, 2020

Memory device and test method thereof

Applicant:

SK Hynix Inc., Gyeonggi-do, KR;

Inventor:

Sang-Ah Hyun, Chungcheongbuk-do, KR;

Assignee:

SK hynix Inc., Gyeonggi-do, KR;

Attorney:

IP & T Group LLP

Primary Examiner:

Thien Nguyen

Int. Cl.
CPC ...
G11C 29/12 (2006.01); G11C 7/12 (2006.01); G11C 7/22 (2006.01); G11C 8/08 (2006.01); G11C 29/14 (2006.01); G11C 29/18 (2006.01); G11C 8/18 (2006.01); G11C 29/02 (2006.01); G11C 29/20 (2006.01); G11C 29/46 (2006.01);
U.S. Cl.
CPC ...
G11C 29/12015 (2013.01); G11C 7/12 (2013.01); G11C 7/222 (2013.01); G11C 8/08 (2013.01); G11C 8/18 (2013.01); G11C 29/025 (2013.01); G11C 29/028 (2013.01); G11C 29/1201 (2013.01); G11C 29/14 (2013.01); G11C 29/18 (2013.01); G11C 29/20 (2013.01); G11C 29/46 (2013.01); G11C 2029/1202 (2013.01); G11C 2029/1204 (2013.01);
Abstract

A semiconductor system includes: a first semiconductor device suitable for outputting a command; and a second semiconductor device suitable for activating a test enable signal based on the command, generating a counting signal representing a toggling number of a row active signal for an activation period of the test enable signal, increasing and outputting an address when the counting signal reaches a target activation number, and deactivating the test enable signal when the counting signal reaches the target activation number and the address has a maximum value.

Find Patent Forward Citations

Hyun, Sang-Ah. (2022). Memory device and test method thereof (U.S. Patent No. 11257561). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11257561

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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