The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2022

Filed:

Jun. 25, 2020
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Liang Li, San Diego, CA (US);

Andrew Evan Gruber, Arlington, MA (US);

Yunshan Kong, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/04 (2011.01); G06T 1/20 (2006.01); G06T 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 15/04 (2013.01); G06T 1/20 (2013.01); G06T 5/001 (2013.01); G06T 2207/20024 (2013.01);
Abstract

The present disclosure relates to methods and apparatus for graphics processing. In some aspects, the apparatus selects a first mip-map layer with a first texture size and a second mip-map layer with a second texture size based on a third texture size of an image. The apparatus also determines a relative distance associated with the texture sizes. Additionally, the apparatus determines a first quantity of samples to select from the first mip-map layer, and determines a second quantity of samples to select from the second mip-map layer, the second quantity of samples being less than the first quantity of samples, and a second quantity of filter taps being less than a first quantity of filter taps. Also, the apparatus generates the image at the third texture size through filtering based on the first quantity of samples and the second quantity of samples.


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