The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2022

Filed:

May. 07, 2018
Applicant:

University of Fukui, Fukui, JP;

Inventors:

Motoharu Fujigaki, Fukui, JP;

Yuichi Akatsuka, Fukui, JP;

Daishi Takata, Fukui, JP;

Assignee:

UNIVERSITY OF FUKUI, Fukui, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/521 (2017.01); G06T 7/55 (2017.01); G06T 7/73 (2017.01); H04N 5/247 (2006.01);
U.S. Cl.
CPC ...
G06T 7/521 (2017.01); G06T 7/55 (2017.01); G06T 7/74 (2017.01); H04N 5/247 (2013.01); G06T 2207/10152 (2013.01); G06T 2207/30204 (2013.01);
Abstract

The relationship between space coordinates and a plurality of feature amounts gained from at least a pattern or a change in the pattern that has been projected from a plurality of projection units is found in advance, and the relationship between the feature amounts and the space coordinates is used in order to find the space coordinates of the surface of an object from the feature amounts that have been gained from a pattern or a change in the pattern projected from the plurality of projection units onto the surface of the object.


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