The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2022

Filed:

Feb. 21, 2020
Applicant:

Topcon Corporation, Tokyo, JP;

Inventors:

Zaixing Mao, Edgewater, NJ (US);

Zhenguo Wang, Ridgewood, NJ (US);

Kinpui Chan, Ridgewood, NJ (US);

Assignee:

TOPCON CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
G06T 5/002 (2013.01); G06T 5/004 (2013.01); G06T 5/50 (2013.01); G06T 2207/10101 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20216 (2013.01); G06T 2207/30041 (2013.01);
Abstract

Ophthalmological images generated by coherent imaging modalities have multiple types of noise, including random noise caused by the imaging system and speckle noise caused by turbid objects such as living tissues. These noises can occur at different levels in different locations. A noise-reduction method and system of the present disclosure thus relates to applying different filters for different types of noise and/or different locations of images, sequentially or in parallel and combined, to produce a final noise-reduced image.


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