The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2022

Filed:

Oct. 09, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Lu Liu, Singapore, SG;

Sia Kai Julian Tan, Singapore, SG;

Kevin A. Dore, II, Wappinger Falls, NY (US);

Steven Hurley, Jr., Denton, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/04 (2006.01); G06N 3/08 (2006.01); G06N 7/00 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 7/005 (2013.01); G06N 3/0454 (2013.01); G06N 3/084 (2013.01); G06N 20/00 (2019.01);
Abstract

An enhanced prediction model utilizing product life cycle segmentation and historic prediction data for generating more accurate future failure rates. Input data is segmented into groups based on failure modes of a corresponding life cycle. A prediction model such as Weibull analysis is implemented for each segmented group. Historical prediction data is also segmented into groups. Prediction parameters for each group of segmented historical prediction data are compared with one another and the comparisons are then used to adjust the prediction parameters generated from the segmented groups of input data. Updated parameters for the input data are then output thereby generating a new future failure rate.


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