The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2022

Filed:

Jul. 20, 2015
Applicant:

University of Southern California, Los Angeles, CA (US);

Inventors:

Kartik Audhkhasi, White Plains, NY (US);

Bart Kosko, Hacienda Heights, CA (US);

Osonde Osoba, Los Angeles, CA (US);

Assignee:

University of Southern California, Los Angeles, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2006.01); G06N 3/04 (2006.01); G06N 7/00 (2006.01); G06K 9/66 (2006.01); G06K 9/62 (2022.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06K 9/6217 (2013.01); G06K 9/6255 (2013.01); G06K 9/66 (2013.01); G06N 3/04 (2013.01); G06N 3/0454 (2013.01); G06N 3/084 (2013.01); G06N 7/005 (2013.01);
Abstract

A learning computer system may include a data processing system and a hardware processor and may estimate parameters and states of a stochastic or uncertain system. The system may receive data from a user or other source. Parameters and states of the stochastic or uncertain system are estimated using the received data, numerical perturbations, and previous parameters and states of the stochastic or uncertain system. It is determined whether the generated numerical perturbations satisfy a condition. If the numerical perturbations satisfy the condition, the numerical perturbations are injected into the estimated parameters or states, the received data, the processed data, the masked or filtered data, or the processing units.


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