The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2022

Filed:

Mar. 16, 2020
Applicant:

Kyndryl, Inc., New York, NY (US);

Inventors:

Daniel S. Riley, Wake Forest, NC (US);

Rhonda L. Childress, Austin, TX (US);

Assignee:

KYNDRYL, INC., New York, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/51 (2013.01); G06F 21/54 (2013.01); G06F 21/57 (2013.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06F 21/51 (2013.01); G06F 21/54 (2013.01);
Abstract

Using a processor and a memory of a testing system, a set of vulnerability testing instructions is executed relative to an application, causing an output of a set of vulnerabilities from the testing system. By executing a probability model, a first probability of adverse impact corresponding to a first vulnerability in the set of vulnerabilities is computed. The first vulnerability and the first probability of adverse impact are added to a vulnerability repository. Using the first probability of adverse impact and a second probability of adverse impact, a first cumulative probability of adverse impact is calculated. Using the first cumulative probability and a first level of organizational impact corresponding to the application, a first risk category is assigned to the application. Responsive to the first risk category being lower than a second risk category, a system management application is caused to install the application in the computer system.


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