The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2022

Filed:

Feb. 20, 2019
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Luke Cirillo, Munich, DE;

Prabaker Balasubramanium, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01); G06F 9/54 (2006.01); G01R 31/3183 (2006.01); G06N 7/00 (2006.01);
U.S. Cl.
CPC ...
G06F 17/18 (2013.01); G01R 31/318342 (2013.01); G06F 9/542 (2013.01); G06N 7/005 (2013.01);
Abstract

A measurement system includes a measurement module, a processing module, and a display. The measurement module is configured to conduct measurements on a device under test in a repetitive manner in order to obtain measurement results assigned to the repeated measurements. The processing module is configured to combine the measurement results obtained. The processing module is also configured to perform a statistical analysis in a live manner in order to calculate at least one of a live statistical significance parameter of the combined measurement results and a time duration required to obtain a certain statistical significance of the measurement results. The display is configured to display at least one of the live statistical significance parameter and the time duration. Further, a method of providing statistical information is described.


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