The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2022
Filed:
May. 01, 2020
Micro Focus Llc, Santa Clara, CA (US);
MICRO FOCUS LLC, Santa Clara, CA (US);
Abstract
Automated test failures that result from automated testing of program code under development are windows to include just the automated test failures occurring for a first time and that are due to automated test code defects or program code defects. The automated test failures that remain after winnowing are clustered into automated test failure clusters that each individually corresponding to a different automated test code defect or a different program code defect. The automated test failure clusters are window to include just the automated test failure clusters that each individually correspond to a different program code defect. The automated test failure clusters that remain after winnowing are output.