The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2022
Filed:
Jul. 14, 2020
Yandex Europe Ag, Lucerne, CH;
Evgeny Vyacheslavovich Kharitonov, Tatarstan, RU;
Aleksey Valyerevich Drutsa, Moscow, RU;
Pavel Viktorovich Serdyukov, Moscow, RU;
YANDEX EUROPE AG, Lucerne, CH;
Abstract
Methods and systems for generating a combined metric parameter for A/B testing comprising: acquiring a respective first metric parameter for a first and second plurality of feature vectors, a combination of the respective first metric parameters being indicative of a direction of a change in user interactions between the control version and the treatment version, acquiring a respective second metric parameter for the first and second plurality of feature vectors, a combination of the respective second metric parameters being indicative of a magnitude of the change in user interactions between the control and treatment version, generating a respective combined control metric parameter for the first plurality of feature vectors and the second plurality of feature vectors, the combination of the respective combined metric parameters being simultaneously indicative of the magnitude and the direction of the change in user interactions between the control and treatment version.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile