The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2022

Filed:

Sep. 26, 2017
Applicant:

Salesforce.com, Inc., San Francisco, CA (US);

Inventors:

James Bock Wunderlich, Burlingame, CA (US);

Michael Dwayne Miller, Boulder, CO (US);

Michael Christopher Olson, Oconomowoc, WI (US);

Vamshidhar Rao Gandham, Union City, CA (US);

Assignee:

salesforce.com, Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 21/62 (2013.01); H04L 12/26 (2006.01); H04L 29/08 (2006.01); H04L 43/50 (2022.01); H04L 67/1097 (2022.01); H04L 67/14 (2022.01); H04L 67/52 (2022.01);
U.S. Cl.
CPC ...
G06F 11/3664 (2013.01); G06F 11/3688 (2013.01); G06F 21/62 (2013.01); H04L 43/50 (2013.01); H04L 67/1097 (2013.01); H04L 67/14 (2013.01); H04L 67/18 (2013.01);
Abstract

Techniques and architectures for creating scratch organizations in a multitenant environment. A scratch organization defined by metadata corresponding to a subject organization is generated. The metadata defines at least a set of privileges for the subject organization to be replicated in the scratch organization. Test data is loaded from a test source that is not the subject organization. Changes to the subject organization are not applied to the scratch organization after creation of the scratch organization and changes to the scratch organization are not applied to the subject organization. One or more test operations are performed on the scratch organization using the loaded test data. The scratch organization is destroyed after the one or more test operations have been performed.


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