The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2022

Filed:

Nov. 14, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Eliza Salkeld, Raleigh, NC (US);

Weichen Wang, Cary, NC (US);

Lucy Lu, Durham, NC (US);

Shanna Hayes, Cary, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); G06N 3/02 (2006.01); G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3452 (2013.01); G06F 11/3447 (2013.01); G06F 17/18 (2013.01); G06N 3/02 (2013.01);
Abstract

A detection modeling system for alerting to analytical model degradation has a processing device and a memory coupled to the processing device. The detection modeling system is configured to perform a distribution analysis on the selected detection model to determine a first health rating for the selected detection model, perform a survival analysis on the selected detection model to determine a second health rating for the selected detection model, generate an indicative score for the detection model based on the first health rating and the second health rating, and compare the indicative score to a threshold value and alert to model degradation based on the comparison.


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