The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2022

Filed:

Sep. 06, 2019
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Dirk Baumgaertel, Altlussheim, DE;

Sonja Barnet, Viernheim, DE;

Raffael Lutz, Bad Schoenborn, DE;

Vivek Methi, Anjangaon Surji, IN;

Stefan Kraus, Bruchsal, DE;

Gaurav Kumar, Madhepura Bihar, IN;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); G06F 9/48 (2006.01); G06F 9/451 (2018.01); G06F 11/30 (2006.01); G06Q 10/06 (2012.01);
U.S. Cl.
CPC ...
G06F 11/3409 (2013.01); G06F 9/451 (2018.02); G06F 9/4843 (2013.01); G06F 11/3024 (2013.01); G06Q 10/06393 (2013.01);
Abstract

A method, a system, and a computer program product for generating and using contextual and adaptable parameters for monitoring of various processes. A plurality of standard parameters for use during execution of a computing process by a computing system are received. At least one standard parameter in the plurality of standard parameters is modified in accordance with one or more contextual features associated with the execution of the computing process. The computing process is executed by the computing system using a combination of at least one standard parameter in the plurality of standard parameters and the at least one modified parameter.


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