The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2022

Filed:

Apr. 17, 2020
Applicant:

Pure Storage, Inc., Mountain View, CA (US);

Inventors:

Eric Mueller, Sunnyvale, CA (US);

Matthew D. Fleming, Santa Clara, CA (US);

Shao-Ting Chang, Milpitas, CA (US);

Pavan Rao, San Jose, CA (US);

Xinyi Shu, Sunnyvale, CA (US);

Assignee:

Pure Storage, Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/20 (2006.01); G06F 11/16 (2006.01); G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2094 (2013.01); G06F 11/1008 (2013.01); G06F 11/1662 (2013.01); G06F 11/1666 (2013.01); G06F 2201/82 (2013.01);
Abstract

A method of failure detection in a storage system is performed by the storage system. The method includes detecting a failure in a nonvolatile random access memory device that is in or coupled to a storage device having storage memory. The storage system has multiple NVRAM devices and multiple storage devices that have storage memory. The method includes taking a portion or all of the NVRAM device offline. Taking a portion or all of the NVRAM device offline is responsive to detecting the failure. Taking a portion or all of the NVRAM device off-line is while keeping online the storage memory of the storage device, sufficient ones of the NVRAM devices, and sufficient ones of the storage devices to provide reliable access to data and metadata in the storage system.


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