The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2022

Filed:

Sep. 26, 2018
Applicants:

Citizen Watch Co., Ltd., Tokyo, JP;

Citizen Machinery Co., Ltd., Nagano, JP;

Inventors:

Takaichi Nakaya, Higashimurayama, JP;

Yasuhiro Kera, Shiki, JP;

Ayami Misono, Nagano, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01);
U.S. Cl.
CPC ...
G05B 19/41815 (2013.01); G05B 19/4183 (2013.01); G05B 19/4187 (2013.01);
Abstract

An abnormality detection device of a machine tool includes a plurality of vibration sensors mounted on a body of the machine tool at a plurality of positions; and a determination portion that determines an operation condition of the machine tool based on vibration information detected by the vibration sensors. The abnormality detection device detects abnormality of the machine tool according to determination information of the determination portion. The determination portion specifies a predetermined item whose machining accuracy lowers based on the mounted position of the vibration sensor that has detected abnormal vibration.


Find Patent Forward Citations

Nakaya, Takaichi. (2022). Abnormality detection device and machine tool including abnormality detection device (U.S. Patent No. 11256236). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11256236

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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