The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2022
Filed:
Oct. 12, 2020
Yale University, New Haven, CT (US);
Andrew Barentine, Cascade, CO (US);
Joerg Bewersdorf, Guilford, CT (US);
Yale University, New Haven, CT (US);
Abstract
One aspect of the invention provides a method of continuously scanning with a localization microscope. The method includes: modifying a position of a sample relative to a field of view (FOV) of the localization microscope to capture a plurality of image frames of the sample, each captured image frame having a limited FOV; acquiring image frames with the localization microscope during at least one position modification; determining a set of localization position coordinates for at least one localizable object in the sample within at least one image frame of the plurality of image frames; determining one or more field of view (FOV) position coordinates for the at least one image frame; and modifying the set of localization position coordinates based on the one or more FOV position coordinates to produce a collection of coordinates covering a larger spatial region than the at least one image frame.