The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2022
Filed:
Jul. 03, 2019
Applicants:
Tsinghua University, Beijing, CN;
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Inventors:
Jun Zhu, Beijing, CN;
Rui-rui Tang, Beijing, CN;
Guo-Fan Jin, Beijing, CN;
Shou-Shan Fan, Beijing, CN;
Assignees:
Tsinghua University, Beijing, CN;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 17/06 (2006.01); G02B 5/10 (2006.01); G02B 27/00 (2006.01);
U.S. Cl.
CPC ...
G02B 17/0642 (2013.01); G02B 5/10 (2013.01); G02B 17/0636 (2013.01); G02B 27/0025 (2013.01);
Abstract
A freeform surface off-axial three-mirror imaging system comprising a primary mirror, a secondary mirror, a tertiary mirror, and a detector. The secondary mirror defines a first location and a second location. Each reflective surface of the primary mirror, the secondary mirror and the tertiary mirror is an xy polynomial freeform surface. A working distance of the freeform surface off-axial three-mirror imaging system is greater than 125 mm.