The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2022
Filed:
Nov. 13, 2018
Valeriy V. Brytik, Houston, TX (US);
Yaxun Tang, Spring, TX (US);
David Gaines, Houston, TX (US);
Fuxian Song, Spring, TX (US);
Anton Spirkin, Broomfield, CO (US);
Valeriy V. Brytik, Houston, TX (US);
Yaxun Tang, Spring, TX (US);
David Gaines, Houston, TX (US);
Fuxian Song, Spring, TX (US);
Anton Spirkin, Broomfield, CO (US);
ExxonMobil Upstream Research Company, Spring, TX (US);
Abstract
A method and apparatus for imaging seismic data includes obtaining an initial model of a subsurface formation, wherein the model includes a plurality of nodes that form at least part of a grid; an initial dip value for the nodes; and a set of origin coordinates for each of the nodes; performing bottom-up ray tracing for each node in the model, resulting in a set of arrival coordinates for each node; identifying a plurality of gathers from the seismic data; for each gather: calculating a set of midpoint coordinates; defining a midpoint vicinity surrounding the set of midpoint coordinates; identifying the nodes having arrival coordinates within the midpoint vicinity; and estimating a unique aperture for each of the gathers based on the respective origin coordinates; storing the estimated apertures in a table; and generating a subsurface volume or image with subsurface reflectors determined with apertures of the respective gathers.