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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11255990 B1

PDFFull Text
Date of Patent:
Feb. 22, 2022

Filed:

Oct. 25, 2017

Internal structure detection system

Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Akira Maeki, Tokyo, JP;

Shiro Mazawa, Tokyo, JP;

Tatsuyuki Saito, Tokyo, JP;

Takao Sakurai, Tokyo, JP;

Tomonori Sekiguchi, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:

Mattingly & Malur, PC

Primary Examiner:

Daniel L Murphy

Int. Cl.
CPC ...
G01V 1/16 (2006.01); G01V 1/18 (2006.01);
U.S. Cl.
CPC ...
G01V 1/168 (2013.01); G01V 1/182 (2013.01); G01V 2210/144 (2013.01);
Abstract

An internal structure detection system includes: two kinds of sensors with different operating principles for receiving reflected waves of vibration applied to an inspection target in an investigation area; and a processing apparatus that detects an internal structure of the inspection target by using the sensor data received by the two kinds of sensors. The two kinds of sensors are deployed in the investigation area with different densities, in a distributed manner.

Find Patent Forward Citations

Maeki, Akira. (2022). Internal structure detection system (U.S. Patent No. 11255990). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11255990

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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