The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2022
Filed:
Aug. 19, 2020
Applicant:
The Government of the United States of America, As Represented BY the Secretary of the Navy, Arlington, VA (US);
Inventor:
Hen-Geul Yeh, Cypress, CA (US);
Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/58 (2020.01); G01R 19/165 (2006.01); H02H 7/22 (2006.01); H02H 1/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/58 (2020.01); G01R 19/1659 (2013.01); H02H 1/0007 (2013.01); H02H 7/22 (2013.01);
Abstract
Real-time detection of high-impedance faults in a distribution circuit is described. The real-time detection of high-impedance faults includes two steps. First, adaptive soft denoising is employed to perform a filtering process on a healthy dataset, and to determine a threshold. This reduces the rate of false alarms. Second, faulty datasets are prefiltered via adaptive soft denoising, then the denoised signals are processed via discrete wavelet transform to perform high-impedance fault detection using the threshold.