The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2022

Filed:

Sep. 15, 2020
Applicant:

Montage Technology Co., Ltd., Shanghai, CN;

Inventors:

Dan Wang, Shanghai, CN;

Ranran Fan, Shanghai, CN;

Xiao Zhu, Shanghai, CN;

Zhongyuan Chang, Shanghai, CN;

Xin Liu, Shanghai, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 31/3177 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3177 (2013.01); G01R 31/31724 (2013.01);
Abstract

A test device and method with built-in self-test logic and a communication device. The test device includes at least one generator and at least one checker which are disposed between a physical layer and a medium access control layer. The at least one generator is configured to generate a protocol pattern to form a data path between the physical layer and the medium access control layer, and generate different pseudo random bit sequence patterns in the data path. The at least one checker is configured to test a data stream in the physical layer and/or the medium access control layer according to the pseudo random bit sequence patterns, thereby locating a fault position.


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