The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2022

Filed:

Oct. 07, 2020
Applicant:

National Instruments Corporation, Austin, TX (US);

Inventors:

David M. Crowley, Cedar Park, TX (US);

Gerardo Orozco Valdes, Austin, TX (US);

Chen Chang, Fremont, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/302 (2006.01); G01R 29/10 (2006.01); G01R 29/08 (2006.01);
U.S. Cl.
CPC ...
G01R 29/105 (2013.01); G01R 29/0871 (2013.01);
Abstract

Various embodiments are presented of a system including an alignment fixture for testing (e.g., rapidly and cheaply) phased array antennas and other devices configured for radio frequency (RF) transmission and/or reception. A device to be tested (e.g., the device under test (DUT)) may be positioned in a testing position by the alignment fixture. The alignment fixture may provide a configurable level of friction to retain the DUT in the testing position. The alignment fixture may provide isolation from electromagnetic interference for the DUT while in the testing position.


Find Patent Forward Citations

Loading…