The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2022

Filed:

Nov. 15, 2017
Applicant:

3m Innovative Properties Company, St. Paul, MN (US);

Inventors:

Eric M. Chinnock, Chanhassen, MN (US);

Christopher R. Yungers, St. Paul, MN (US);

Subhalakshmi M. Falknor, Woodbury, MN (US);

David H. Redinger, Afton, MN (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/04 (2006.01); H01R 4/62 (2006.01); G01N 27/20 (2006.01); F41H 5/04 (2006.01);
U.S. Cl.
CPC ...
G01N 27/20 (2013.01); G01N 27/041 (2013.01); H01R 4/62 (2013.01); F41H 5/0414 (2013.01);
Abstract

A measurement system may include control electronics; an electrical signal source; a plurality of measurement system electrical contacts; at least one feature for repeatably electrically connecting the plurality of measurement system electrical contacts to selected locations of a tested material. The control electronics may be configured to cause the electrical signal source to output an electrical signal; determine a measured voltage in response to the electrical signal using a measurement electrical contact from the plurality of measurement system electrical contacts. The measurement electrical contact is electrically coupled to the tested material. The control electronics also may be configured to determine whether the tested material includes a crack or other defect based on the measured voltage.


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