The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2022

Filed:

Jul. 30, 2018
Applicant:

Kyocera Corporation, Kyoto, JP;

Inventors:

Yuji Masuda, Yasu, JP;

Masashi Yoneta, Kagoshima, JP;

Jumpei Nakazono, Kirishima, JP;

Assignee:

KYOCERA CORPORATION, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/10 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1056 (2013.01); G01N 2015/0046 (2013.01);
Abstract

A measurement apparatus according to the present disclosure is a measurement apparatus capable of measuring particles in a fluid and comprises: a flow path device including a first flow path with translucency through which a first fluid including the particles passes and a second flow path with translucency through which a second fluid which does not include the particles passes; an optical sensor facing the flow path device, irradiating each of the first flow path and the second flow path with light, and receiving light passing through each of the first flow path and the second flow path; and a controller measuring the particles by comparing an intensity of light passing through the first flow path and an intensity of light passing through the second flow path, each of which is obtained by the optical sensor.


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