The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2022
Filed:
Aug. 15, 2019
Pratt & Whitney Canada Corp., Longueuil, CA;
Mario Blais, Varennes, CA;
Clement Drouin Laberge, Terrebonne, CA;
PRATT & WHITNEY CANADA CORP., Longueuil, CA;
Abstract
The present disclosure relates to methods and systems for measuring a component. First measurements for a plurality of features of the component are obtained from a first measurement instrument. Second measurements for at least one of the plurality of features of the component are obtained from a second measurement instrument, the second measurement instrument having a higher measurement resolution than the first measurement instrument. A scaling factor for the at least one of the plurality of features, which relates the first measurements to the second measurements, is determined. Scaled measurements for the plurality of features of the component are generated by applying the scaling factor to the first measurements. The scaled measurements are output as measurements of the component.