The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2022

Filed:

Oct. 06, 2017
Applicant:

View, Inc., Milpitas, CA (US);

Inventors:

Jason David Zedlitz, Rancho Cordova, CA (US);

Yuyang Ying, San Jose, CA (US);

Jue Wang, San Jose, CA (US);

Stephen Clark Brown, San Mateo, CA (US);

Assignee:

View, Inc., Milpitas, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/42 (2006.01); E06B 3/67 (2006.01); E06B 9/68 (2006.01); G01W 1/12 (2006.01); G01J 1/04 (2006.01); G01J 5/10 (2006.01); G01W 1/06 (2006.01); G01J 1/02 (2006.01);
U.S. Cl.
CPC ...
G01J 1/4228 (2013.01); E06B 3/6715 (2013.01); E06B 9/68 (2013.01); G01J 1/0271 (2013.01); G01J 1/0407 (2013.01); G01J 5/10 (2013.01); G01W 1/06 (2013.01); G01W 1/12 (2013.01);
Abstract

The present disclosure generally relates to infrared cloud detector systems and methods for detecting cloud cover conditions. The infrared cloud detector system comprises an infrared sensor, an ambient temperature sensor, and logic. The infrared sensor is configured to measure sky temperature based on infrared radiation received within its field-of-view. The ambient temperature sensor is configured to measure an ambient temperature. And the logic is configured to determine a cloud condition based on a difference between the measured sky temperature and the measured ambient temperature.


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