The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2022
Filed:
Sep. 18, 2019
Hitachi, Ltd., Tokyo, JP;
Takuya Komatsuda, Tokyo, JP;
Takuya Oda, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
An analysis support apparatus includes: a feature interpreting section extracting a feature from a target analysis model generated from vibration data and classifying the feature into an abnormality determination feature, or a feature representing a vibration and enabling determining whether abnormality occurs; an abnormality determination range creating section identifying a range being determined to be abnormal of the abnormality determination feature of the target analysis model as an abnormality determination range; a similar model selecting section calculating an overlapping degree indicating how much the abnormality determination ranges of the target analysis model and one or more predetermined reference analysis models overlap and selecting, based on the overlapping degree, a similar analysis model similar to the target analysis model from the reference analysis models; and an abnormality range difference calculating section extracting a difference between the abnormality determination ranges of the target analysis model and the similar analysis model.