The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2022
Filed:
Aug. 05, 2020
Denso Corporation, Kariya, JP;
Noboru Kitahara, Kariya, JP;
Teruaki Kaifu, Kariya, JP;
Kengo Ito, Kariya, JP;
Hiroyuki Akuzawa, Kariya, JP;
Hiroshi Tagawa, Kariya, JP;
DENSO CORPORATION, Kariya, JP;
Abstract
A physical quantity measurement device includes a housing forming a through flow path, and a measurement flow path branching from the through flow path. A physical quantity sensor is provided in the measurement flow path. An inner surface of the housing includes an inlet ceiling surface and an inlet floor surface which face each other and define an inlet through path that is between and connects an inlet of the through flow path and an inlet of the measurement flow path, The inlet ceiling surface includes a ceiling inclined surface that extends from the inlet of the through flow path and is inclined with respect to the inlet floor surface. A distance between the ceiling inclined surface and the inlet floor surface gradually decreases in a direction from the inlet of the through flow path toward an outlet of the through flow path.