The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2022

Filed:

Aug. 31, 2020
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Anand Dabak, Plano, TX (US);

Venkata Ramanan, Tucson, AZ (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F 1/66 (2006.01); G06F 17/15 (2006.01); G01F 1/667 (2022.01);
U.S. Cl.
CPC ...
G01F 1/66 (2013.01); G01F 1/662 (2013.01); G01F 1/667 (2013.01); G06F 17/15 (2013.01);
Abstract

A method of calculating a time difference is disclosed. The method includes sampling a first ultrasonic signal (r) to produce a first sampled signal (y1()) and sampling a second ultrasonic signal (r) to produce a second sampled signal (y2()). A first time (LEAD_LAG) is determined between a time the first sampled signal crosses a threshold (θ1) and a time the second sampled signal crosses the threshold. The first sampled signal is cross correlated with the second sampled signal to produce a second time (SAMP_OFFSET). The time difference is calculated in response to the first and second times.


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