The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2022
Filed:
Jun. 23, 2020
Hongfujin Precision Electronics(tianjin)co.,ltd., Tianjin, CN;
Wan-Hsin Tarng, New Taipei, TW;
Han-Ting Hsu, New Taipei, TW;
HONGFUJIN PRECISION ELECTRONICS (TIANJIN) CO., LTD., Tianjin, CN;
Abstract
A method for setting testing thresholds applied by a testing device to products being made includes obtaining an initial lower threshold for testing the products and counting, followed by manual review, first, second, third, and fourth type product qualities as being quantities under the initial lower threshold. The method adds a minimum product parameter of defective products, the initial lower threshold, and a number of values between the minimum product parameter and the initial lower threshold into a set, repeating the application of one selected element from the set as an experiment threshold. First to fourth type quantities of the current products are counted again under the experiment threshold, an effectiveness of each element of the set is calculated, and an element of the set with the maximum effectiveness is defined as a suggested lower threshold for testing the products.