The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2022

Filed:

Jul. 09, 2021
Applicant:

The Government of the United States of America, As Represented BY the Secretary of Homeland Security, Washington, DC (US);

Inventor:

Mark A. Fry, Marco Island, FL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B25J 9/00 (2006.01); B25J 9/16 (2006.01); B25J 19/02 (2006.01); B25J 13/08 (2006.01); B25J 9/04 (2006.01);
U.S. Cl.
CPC ...
B25J 9/1697 (2013.01); B25J 9/043 (2013.01); B25J 9/1612 (2013.01); B25J 13/087 (2013.01); B25J 19/023 (2013.01); B25J 19/027 (2013.01);
Abstract

Systems and methods are described, and an example system includes a transport bin configured to carry a baggage item and having spatial reference frame marking detectable by electromagnetic scan and by machine vision. The system includes a robotic arm apparatus at an inspection area, and includes a switched path baggage conveyor that, responsive to electromagnetic scan detection of an object-of-interest (OOI) within the baggage item, conveys the transport bin to the inspection area. The electromagnetic scan generates OOI geometric position information indicating geometric position of the OOI relative to the spatial reference frame marking. The robotic arm apparatus, responsive to receiving the transport bin, uses machine vision to detect orientation of the spatial reference frame marking, then translates OOI geometric position information to local reference frame, for robotic opening of the baggage item, and robotic accessing and contact swab testing on the OOI.


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