The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2022

Filed:

May. 19, 2020
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Masaya Soga, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/00 (2006.01); G06T 3/40 (2006.01); H04N 1/393 (2006.01);
U.S. Cl.
CPC ...
H04N 1/0044 (2013.01); G06T 3/40 (2013.01); H04N 1/00482 (2013.01); H04N 1/393 (2013.01); G06T 2210/22 (2013.01); H04N 2201/0094 (2013.01);
Abstract

To enable a user to, in a case where the user scans a plurality of documents en bloc and acquires an image in units of documents by using a multi-cropping function and metadata thereon, reacquire them efficiently. A configuration is designed so that scan processing can be performed again in a preview display of the image corresponding to each document obtained by multi-cropping and it is made possible for a user to perform the scan again in a case where the user checks the scanned contents by the preview display and determines that the scan has not been performed accurately. Then, for the scanned image obtained by the re-scan, necessary analysis processing is performed only for the document for which it becomes necessary to perform the scan again.


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