The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2022

Filed:

Apr. 03, 2019
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Weizhong Yan, Clifton Park, NY (US);

Masoud Abbaszadeh, Clifton Park, NY (US);

Assignee:

GENERAL ELECTRIC COMPANY, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
H04L 63/1425 (2013.01); G06N 20/00 (2019.01);
Abstract

A Cyber-Physical System ('CPS') may have monitoring nodes that generate a series of current monitoring node values representing current operation of the CPS. A normal space data source may store, for each monitoring node, a series of normal monitoring node values representing normal operation of the CPS. An abnormal data generation platform may utilize information in the normal space data source and a generative model to create generated abnormal to represent abnormal operation of the CPS. An abnormality detection model creation computer may receive the normal monitoring node values (and generate normal feature vectors) and automatically calculate and output an abnormality detection model including information about a decision boundary created via supervised learning based on the normal feature vectors and the generated abnormal data.


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