The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2022
Filed:
Nov. 04, 2019
Applicant:
GE Precision Healthcare Llc, Milwaukee, WI (US);
Inventor:
Raz Carmi, Haifa, IL;
Assignee:
GE Precision Healthcare LLC, Milwaukee, WI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06N 3/08 (2006.01); G06N 3/04 (2006.01); G16H 30/20 (2018.01); A61B 6/00 (2006.01); A61B 6/12 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0016 (2013.01); A61B 5/7267 (2013.01); A61B 6/12 (2013.01); A61B 6/4057 (2013.01); G06N 3/0454 (2013.01); G06N 3/08 (2013.01); G16H 30/20 (2018.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30096 (2013.01); G06T 2207/30168 (2013.01);
Abstract
Various methods and systems are provided for comparison of medical scan images during functional imaging evaluation. In one example, structural similarity between a first scan image and a second scan image of a lesion may be determined by implementing a deep learning model including plurality of neural networks trained with base structures and different perturbations of base structures, and ranking structural similarity based on a selected neural network model trained with perturbations of base structures corresponding to the structural difference between the first and second scan images.