The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2022
Filed:
Jan. 17, 2020
Konica Minolta, Inc., Tokyo, JP;
Makoto Oki, Hino, JP;
KONICA MINOLTA, INC., Tokyo, JP;
Abstract
An inspection image is assumed to contain many abnormalities when a reference image and an inspection image are misaligned. It has been impossible to determine whether the abnormalities are attributed to the inspection image. An image inspecting apparatus includes: a print alignment portion that aligns a print position of a reference image with a print position of an inspection image; an abnormality detector that detects an abnormality in the inspection image based on a difference between the reference image and the inspection image after print positions are aligned; and a print alignment result evaluator that evaluates a print position alignment result from aligning a print position of the reference image with a print position of the inspection image including an abnormality detected based on dispersion of the difference included in an evaluation region around an edge calculated from a printout image included in the reference image.